[Date Prev][Date Next][Thread Prev][Thread Next][Date Index][Thread Index]

Tval test circuits



Hi,

Can anyone explain how the test circuits/loads for the Tval measurement
were derived?

Robert

-- 
Robert Lindsell, Senior Hardware Engineer   |
robertl@research.canon.com.au
Canon Information Systems Research Australia| Phone: +61-2-9805-2876
PO Box 313 NORTH RYDE NSW 2113              | Fax:   +61-2-9805-2929